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Fault Sense

An image processing/analysis application. for the purposes of fault detection of products produced in real time environments. Designed to be deployed in isolation on an embedded device.


Dataset Overview

This project is developed specifically for use on the VisA (Visual Anomoly Dataset).

Object # normal samples # anomaly samples # anomaly classes object type
PCB1 1,004 100 4 Complex structure
PCB2 1,001 100 4 Complex structure
PCB3 1,006 100 4 Complex structure
PCB4 1,005 100 7 Complex structure
Capsules 602 100 5 Multiple instances
Candle 1,000 100 8 Multiple instances
Macaroni1 1,000 100 7 Multiple instances
Macaroni2 1,000 100 7 Multiple instances
Cashew 500 100 9 Single instance
Chewing gum 503 100 6 Single instance
Fryum 500 100 8 Single instance
Pipe fryum 500 100 9 Single instance
Attribute Total
Objects 12
Samples 10,821
Normal Samples 9,621
Anomoly Samples 1200
Unique Anomoly Classes

A more comprehensive breakdown and sample images from specific classes can be obtained in the following document.


Building & Running the Project

Data Preparation

From the project root execute the following commands in order.

cd build/
cmake .
make
./data-preperation
Building CLI Interface

From the root of the project run.

cd src/main/frontend/build/
cmake .
make
Running Application

the fault-sense-cli executable will then be available in the current working directory.

To view available commands execute:

./fault-sense-cli --help

Example command:

./fault-sense-cli view -i ../../../../data/sample-images/chewinggum-anomoly.JPG

Note: press 'q' to exit


Dependencies

  1. opencv2
  2. Catch2 (for testing)

Further Information

Name Description
dataset-examples-and-descriptions Contains a detailed breakdown of the dataset. Including overview statistics and object and class breakdowns.
project-managment Contains links to the tools used for tracking and planning project progression
testing Contains descriptions on how and where to build, run and add to the project test suite.

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An image processing/analysis application. for the purposes of fault detection of products produced in real time enviorments. Designed to be deployed in isolation on an embedded device.

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