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This repository was archived by the owner on Nov 1, 2020. It is now read-only.
We should refactor the existing static/instance field layout type system tests to be easily extensible to other platform. Currently, the expected offsets are hardcoded to a specific number and the architecture is hardcoded to x64 (aka AMD64 or x86-64).
What we want is probably a data structure that has expected field offsets for each architecture and a driver that iterates over all architectures and for each architecture tests that the computed offsets match the expected values.
I didn't do it initially because the tests are a line-by-line port from the tests for the .NET Native NUTC compiler and we don't support anything but x64 right now anyway.
We should refactor the existing static/instance field layout type system tests to be easily extensible to other platform. Currently, the expected offsets are hardcoded to a specific number and the architecture is hardcoded to x64 (aka AMD64 or x86-64).
What we want is probably a data structure that has expected field offsets for each architecture and a driver that iterates over all architectures and for each architecture tests that the computed offsets match the expected values.
I didn't do it initially because the tests are a line-by-line port from the tests for the .NET Native NUTC compiler and we don't support anything but x64 right now anyway.